Sovremennye problemy distantsionnogo zondirovaniya Zemli iz kosmosa, 2022, Vol. 19, No. 3, pp. 114-118
High precision star orientation device for a new generation remote sensing spacecraft
R.V. Bessonov
1 , N.N. Brysin
1 , A.N. Vasileiskaya
1 , S.V. Voronkov
1 , A.A. Kobeleva
1 , N.A. Stroilov
1 1 Space Research Institute RAS, Moscow, Russia
Accepted: 15.06.2022
DOI: 10.21046/2070-7401-2022-19-3-114-118
The article reviews the technical details of creating a new generation stellar orientation device. The device is intended for use on remote sensing satellites of high and ultra-high resolution both for use in the angular motion control system and for providing high-precision georeferencing of remote sensing images by measuring orientation parameters with errors of fractions of an arc second. The device created in the Space Research Institute has become the most high-precision stellar orientation device in the world, not counting the American analogue weighing 25 kg. The article describes the difficulties that the developers had to face in order to ensure the accuracy of measuring the orientation parameters by the device in fractions of an arc second. Among them are the problems of ensuring optimal focusing of an optical system with a narrow range of sharpness, building a thermally stable design, ensuring the radiation resistance of a CMOS matrix by building a refrigerator based on a Peltier element. The use of high-aperture wide-field optics with a small pixel led to the fact that the focusing range of the device was about 10 µm, while the focal plane of the objective shifted by 40 µm when passing from air to vacuum. Thus, to ensure the operability of the device and its characteristics in real flight conditions, it was necessary to create high-precision vacuum and optical stands and a large amount of testing.
Keywords: stellar orientation device, high-precision orientation of spacecraft, remote sensing images georeferencing, radiation resistance of CMOS matrices, construction of thermally stable structures, stands for optical measurements
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