Sovremennye problemy distantsionnogo zondirovaniya Zemli iz kosmosa, 2017, Vol. 14, No. 3, pp. 128-138
The conceptual and analytical models of optoelectronic survey with prior exposure metering on board a spacecraft
A.N. Grigoriev
1 , E.A. Dudin
1 , D.S. Korshunov
1 , V.V. Oktiabrskii
1 1 Military-Space Academy, Saint Petersburg, Russia
Accepted: 21.03.2017
DOI: 10.21046/2070-7401-2017-14-3-128-138
The article presents the results of a research on improving the quality of data of satellite multispectral survey. The object of the research is space optical-electronic system for remote sensing of the Earth. The subject of investigation is parameter selection procedures of surface imaging. The paper presents the conceptual model of optoelectronic survey with prior exposure metering aboard the spacecraft. This model differs from the known techniques due to use of additional special onboard complex. This complex is used to measure the factual ascending radiation flux. We have developed the analytical model of quality indicator of multispectral satellite imagery. The indicator is the value of ground linear resolution. The calculation of linear resolution is based on considering characteristics of the main parts of the optoelectronic channel and external conditions of the optoelectronic survey. The model provides the optimal exposure definition based on specified criteria. The results of computational experiments demonstrate the dependence of ground linear resolution on external survey conditions. The research shows that images recorded at the same exposure in different spectral bands vary in quality. Proceeding from the results, we conclude that each band of the special optoelectronic complex requires individual exposure setting.
Keywords: modeling, exposure, linear ground resolution, multispectral survey
Full textReferences:
- Baklanov A.I., Sistemy nablyudeniya i monitoringa (Observation and monitoring systems), Moscow: BINOM. Laboratoriya znanii, 2009, 234 p.
- Veselov Yu.G., Ostrovskii A.S., Sel'vesyuk N.I., Krasavin I.V., Otsenka predel'nogo razresheniya tsifrovykh optiko-elektronnykh sistem distantsionnogo zondirovaniya zemli s ispol'zovaniem teorii lineinykh sistem (Estimation of the limiting resolution of digital optoelectronic systems for remote sensing using the theory of linear systems), Izvestiya YuFU. Tekhnicheskie nauki, 2013, No. 3 (140), pp. 84–89.
- Grigor'ev A.N., Korshunov D.S., Belyaev A.S., Prognozirovanie kachestva kosmicheskikh snimkov kosmicheskikh sistem distantsionnogo zondirovaniya (Prediction of satellite images quality of remote sensing space systems), Trudy Voenno-kosmicheskoi akademii imeni A.F. Mozhaiskogo, 2010, No. 629, pp. 143–147.
- Khartov V.V., Efanov V.V., Zanin K.A. Osnovy proektirovaniya orbital'nykh optiko-elektronnykh kompleksov (Basis of orbital optical-electronic complexes design), Moscow: Izdatel'stvo MAI, 2011, 127 p.